SJ/T 11856.3-2022 Part 3: EML Chip for Optical Fiber Communication Light Sources

Full Standard Name

Specification for Semiconductor Laser Chip Used in Optical Fiber Communication - Part 3: Electro-Absorption Modulated Semiconductor Laser Chip for Light Sources

SJ/T 11856.3-2022 Specification for Semiconductor Laser Chip Used in Optical Fiber Communication - Part 3: Electro-Absorption Modulated Semiconductor Laser Chip for Light Sources

Standard Details

Sector / Industry Electronics
Standard Type SJ/T (Recommended)
Standard Status Valid
Older Standard None
CCS Classification M33
ICS Classification 33.180
Issue Date 2022-10-20
Implementation Date 2023-01-01
File Type PDF
PDF Page Count About 18 pages
Competent Department China Electronics Standardization Institute under the Ministry of Industry and Information Technology
Quoted Standard GB/T 2828.1, GB/T 2548-2008, GB/T 31358-2015, GB/T 31359-2015, GB/T 33768-2017

SJ/T 11856.3-2022 (English Version)

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SJ/T 11856.3-2022 (Chinese Version)

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Standard Introduction

SJ/T 11856.3-2022 specifies the technical requirements for electro-absorption modulated semiconductor laser chips used as light sources in optical fiber communication. 

It covers terminology and definitions, abbreviations, optoelectronic characteristics, chip material, surface quality, chip dimensions, shear force and gold-wire bonding strength, ESDS requirements, environmental reliability, test methods, inspection rules, packaging, marking, product instructions and storage.

Standard Catalog

The standard consists of the following main sections:

  • 1 Scope 1

  • 2 Normative References 1

  • 3 Terms and Definitions 1

  • 4 Abbreviations 2

  • 5 Technical Requirements 2

  • 5.1 Optoelectronic Characteristics 2

  • 5.2 Chip Material 4

  • 5.3 Surface Quality 4

  • 5.4 Chip Dimensions 4

  • 5.5 Shear Force and Gold-Wire Bonding Strength 4

  • 5.6 ESDS Test Requirements 4

  • 5.7 High-Temperature Storage 4

  • 5.8 Low-Temperature Storage 4

  • 5.9 Temperature Cycling 4

  • 5.10 Steady Damp Heat 4

  • 5.11 High-Temperature Life 4

  • 5.12 Steady Damp Heat, Operating 4

  • 6 Test Methods 5

  • 6.1 Test Environmental Conditions 5

  • 6.2 Test Instrument Requirements 5

  • 6.3 Optoelectronic Characteristics 5

  • 6.4 Physical Characteristics 6

  • 6.5 Environmental Adaptability 7

  • 7 Inspection Rules 7

  • 7.1 Inspection Classification 7

  • 7.2 Screening 7

  • 7.3 Factory Inspection 8

  • 7.4 Type Inspection 8

  • 8 Packaging, Marking, Product Instructions and Storage 9

  • 8.1 Packaging 9

  • 8.2 Marking 10

  • 8.3 Product Instructions 10

  • 8.4 Storage 10

  • 9 Other Requirements 10

  • Appendix A Wavelength Allocation Tables 11

  • A.1 DWDM Wavelength Allocation 11

  • A.2 LWDM Wavelength Allocation 12

  • A.3 CWDM Wavelength Allocation 12

  • A.4 Wavelength Range for WDM Applications 13

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