SJ/T 11402-2009 Optical Fiber Communication Laser Chip Spec

Full Standard Name

Technical Specification of Semiconductor Laser Chip Used in Optical Fiber Communication

SJ/T 11402-2009 Technical Specification of Semiconductor Laser Chip Used in Optical Fiber Communication

Standard Details

Sector / Industry Electronics
Standard Type SJ/T (Recommended)
Standard Status Valid
Older Standard None
CCS Classification M33
ICS Classification 33.180
Issue Date 2009-11-17
Implementation Date 2010-01-01
File Type PDF
PDF Page Count About 12 pages
Competent Department China Electronics Standardization Institute
Quoted Standard GB/T 15651, GB/T 21194-2007, GJB 548A-1996, YD/T 701-1993

SJ/T 11402-2009 (English Version)

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Standard Introduction

SJ/T 11402-2009 specifies the technical requirements for semiconductor laser chips used in optical fiber communication. 

It covers terminology, classification, optoelectronic performance, chip material, chip dimensions, surface quality, environmental testing, electrostatic discharge sensitivity, high-temperature life requirements, inspection rules, measurement methods, packaging and storage.

Standard Catalog

The standard consists of the following main sections:

  • 1 Scope 1

  • 2 Normative References 1

  • 3 Abbreviations, Symbols and Definitions 1

  • 3.1 Abbreviations 1

  • 3.2 Terms, Symbols and Definitions 1

  • 4 Requirements 1

  • 4.1 Classification 1

  • 4.2 Optoelectronic Characteristics 2

  • 4.2.1 Absolute Maximum Ratings 2

  • 4.2.2 Optoelectronic Technical Characteristics 2

  • 4.3 Chip Material 4

  • 4.4 Chip Dimensions 4

  • 4.5 Surface Quality Requirements 4

  • 4.6 Environmental Test Requirements 4

  • 4.7 ESDS Test Requirements 4

  • 4.8 High-Temperature Life Requirements 4

  • 5 Inspection Rules 4

  • 5.1 Inspection Classification 4

  • 5.2 Composition of Inspection Lots 4

  • 5.3 Quality Assessment Procedure 5

  • 5.4 Screening 5

  • 5.5 Qualification Inspection 5

  • 5.6 Quality Conformance Inspection 6

  • 6 Measurement and Test Methods 7

  • 6.1 Standard Atmospheric Conditions for Measurement and Testing 7

  • 6.2 Equipment and Instruments for Inspection 7

  • 6.3 Optoelectronic Characteristic Measurement Methods 7

  • 6.4 Chip Dimension Measurement Method 8

  • 6.5 Surface Quality Inspection Method 8

  • 6.6 Environmental Test Methods 8

  • 6.7 ESDS Test Method 9

  • 6.8 High-Temperature Life Test Method 9

  • 7 Packaging and Storage 9

  • 7.1 Packaging 9

  • 7.2 Storage 9

  • 8 Precautions 9

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